Technologies

CA20

Compact and versatile solution from 2D and 3D microfocal inspection for semicon, advanced packaging and science and research.

XS Series

The XS-platform series is a small-footprint high-resolution automated X-ray inspection system concept.

Are you interested in semicon X-RAY or want more information?

Ing. Miloš Drlík

Key Account Manager

drlik@imtts.cz
+420 727 872 614
request a solution

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